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Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

Posted By: AvaxGenius
Date: 23 May 2021 21:22:50
Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

Testing Static Random Access Memories: Defects, Fault Models and Test Patterns by Said Hamdioui
English | PDF | 2004 | 231 Pages | ISBN : 1402077521 | 19.5 MB

Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port.
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