CTL for Test Information of Digital ICs by Rohit Kapur
English | PDF | 2002 | 183 Pages | ISBN : 1402072937 | 2.7 MB
CTL is a language that is used to represent test information. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test information about a core. The language has been designed to be generally applicable for a number of activities in digital IC testing. This book is focused on describing CTL.