Design, Automation, and Test in Europe: The Most Influential Papers of 10 Years DATE (repost)
Design, Automation, and Test in Europe: The Most Influential Papers of 10 Years DATE
Springer; 1 edition | March 4, 2008 | ISBN-10: 140206487X | 516 pages | PDF | 3.1 Mb
Springer; 1 edition | March 4, 2008 | ISBN-10: 140206487X | 516 pages | PDF | 3.1 Mb
The Design, Automation and Test in Europe (DATE) conference celebrated in 2007 its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry.
The papers were grouped in six sections:
* System Level Design;
* Networks on Chip;
* Modeling, Simulation and Run-Time Management;
* Digital Systems in CMOS and Beyond;
* Physical Design and Validation; and
* Test and Verification.