"X-Ray Spectroscopy" ed. by Shatendra K. Sharma

This book consists of selected chapters on the recent applications of x-ray spectroscopy that are of great interest to the scientists and engineers working in the fields of material science, physics, chemistry, astrophysics, astrochemistry, instrumentation, and techniques of x-ray based characterization. The book covers some basic principles of satellite x-rays as characterization tools for chemical properties and the physics of detectors and x-ray spectrometer. The techniques like EDXRF, WDXRF, EPMA, satellites, micro-beam analysis, particle induced XRF, and matrix effects are discussed. The characterization of thin films and ceramic materials using x-rays is also covered.

The chapters have been grouped into two major sections based upon the techniques and applications.

Contents
Preface
Part 1 XRF Processes and Techniques
1 X-Ray Spectroscopy Tools for the Characterization of Nanoparticles
2 A Practical Application of X-Ray Spectroscopy in Ti-AI-N and Cr-AI-N Thin Films
3 High Resolution X-Ray Spectroscopy with Compound Semiconductor Detectors and Digital Pulse Processing Systems
4 Analysis of the К Satellite Lines in X-Ray Emission Spectra
5 Application of Wavelength Dispersive X-Ray Spectroscopy in X-Ray Trace Element Analytical Techniques
Part 2 Characterization and Analytical Applications of X-Rays
6 The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science
7 Chemical Quantification of Mo-S, W-Si and Ti-V by Energy Dispersive X-Ray Spectroscopy
8 Quantification in X-Ray Fluorescence Spectrometry
9 The Interaction of High Brightness X-Rays with Clusters or Bio-Molecules
10 Employing Soft X-Rays in Experimental Astrochemistry
11 X-Ray Analysis on Ceramic Materials Deposited by Sputtering and Reactive Sputtering for Sensing Applications
12 Application of Stopped-Flow and Time-Resolved X-Ray Absorption Spectroscopy to the Study of Metalloproteins Molecular Mechanisms
13 Nanoscale Chemical Analysis in Various Interfaces with Energy Dispersive X-Ray Spectroscopy and Transmission Electron Microscop