"Thin Film Analysis by X-Ray Scattering" by Mario Birkholz, et al. (Repost)
"Thin Film Analysis by X-Ray Scattering" by Mario Birkholz, Fewster P.F., Genzel C.
Wiley | 2006 | ISBN: 3527310525 9783527310524 | 381 pages | PDF | 5 MB
Wiley | 2006 | ISBN: 3527310525 9783527310524 | 381 pages | PDF | 5 MB
This volume is dedicated to thin films and their manifold uses and applications. The author undertakes in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen.
Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions.
Contents
Preface
Symbols
1 Principles of X-ray Diffraction
2 Identification of Chemical Phases
3 Line Profile Analysis
4 Grazing Incidence Configurations
5 Texture and Preferred Orientation
6 Residual Stress Analysis
7 High-Resolution X-ray Diffraction
Index
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