Advanced Materials Characterization Techniques (Analytical)

From Microscopy to Spectroscopy: A Comprehensive Approach, Electron Microscopy, Thermal analysis, X-ray Diffraction

What you'll learn

Students will learn the fundamental principles of various advanced materials characterization techniques and describe their applications in Materials analysis

students will learn analyzing data from advanced techniques, demonstrating the ability to interpret results and correlate them with material properties

Students will be able to critically assess and select appropriate characterization techniques for different types of materials based on strengths and limitatons

Students will apply advanced characterization techniques to solve real-world materials challenges, demonstrating critical thinking and problem-solving skills

Requirements

No Specific Pre-Requisite. A general science background knowledge is sufficient

Description

This course provides an in-depth exploration of cutting-edge techniques used to characterize materials at the micro and nanoscale. Designed for graduate students and professionals in materials science, engineering, and related fields, the course will cover a range of advanced characterization methods, including:Electron Microscopy: Techniques such as Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM), Auger Electron Microscopy for high-resolution imaging and analysis.X-ray Diffraction (XRD): Understanding crystal structures and phase identification in materials.Spectroscopic Methods: in depth understanding of spectroscopic techniques like  Raman Spectroscopy, energy dispersive x-ray spectroscopy, and x-ray photoelectron spectroscopy.Thermal Analysis: Exploring Differential Scanning Calorimetry (DSC), differential thermal analysis (DTA) and Thermogravimetric Analysis (TGA) to study thermal properties.Atomic Force Microscopy: Microscopy at the level will be studied through Atomic force microscopy commonly known as AFM.Through a series of lectures, and case studies, students will gain practical experience in selecting and applying the appropriate characterization techniques for various materials. The course will also emphasize the importance of data interpretation and the role of advanced characterization in materials development and innovation.By the end of the course, participants will be equipped with the skills and knowledge necessary to conduct comprehensive materials characterization, enabling them to contribute to advancements in material design and application across multiple industries.

Overview

Section 1: Introduction

Lecture 1 Introduction

Section 2: Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM)

Lecture 2 Introduction and Development of Electron Microscopy

Lecture 3 Kanaya Okayama Formula and Electron Matter interactions

Lecture 4 SEM Instrumentation and Working Principle

Lecture 5 SEM Instrumentation

Lecture 6 Transmission Electron Microscopy (TEM) Instrumentation and Working Principle

Lecture 7 Comparison of SEM and TEM

Section 3: Atomic Force Microscopy (AFM)

Lecture 8 Atomic force microscopy (AFM)-Atomic Forces

Lecture 9 Principle of AFM

Lecture 10 working of AFM

Lecture 11 Modes of AFM and comparison with other microscopies

Lecture 12 Limitations and Applications of AFM

Section 4: X-ray photoelectron spectroscoy (XPS) and Auger Electron Spectroscopy (AES)

Lecture 13 XPS- Photoelectric effect and X-rays

Lecture 14 Binding energy, kinetic energy and work function

Lecture 15 XPS-Instrumentation

Lecture 16 Phenomenon associated with XPS

Lecture 17 Chemical Shifts and Spin Orbit Coupling

Lecture 18 Final Shake Up and Shake off Effects

Lecture 19 Angle Resolved XPS

Section 5: Raman Spectroscopy

Lecture 20 Raman Spectroscopy, Raman Effects (Stokes and anti-Stokes Shift)

Lecture 21 Comparison of Raman with IR

Lecture 22 Raman Instrumentation

Section 6: Electron Energy Loss Spectroscopy

Lecture 23 Electron Energy Loss Spectroscopy

Lecture 24 Surface Plasmons and High energy Loss region

Lecture 25 White lines, Fine Edge Structure in XPS, Applications and Comparison with EDX

Lecture 26 EELS Spectral Analysis

Section 7: Energy Dispersive X-Ray Spectroscopy (EDS or EDX)

Lecture 27 EDX, Mechanism and Production of X-ray

Lecture 28 EDX Instrumentation

Lecture 29 EDX Instrumentations II and Applications of EDX

Section 8: X-ray Diffraction Analysis (XRD)

Lecture 30 XRD principle and Bragg's Equation

Lecture 31 XRD Instrumentation and Transmission Laue Method

Lecture 32 Rotating Crystal method and Powder method of XRD

Lecture 33 Spectral analysis of XRD and Small and Wide anlge Scattering (SAXS, WAXS)

Section 9: Thermogravimetric Analysis (TGA)

Lecture 34 Working Principle of TGA

Lecture 35 Instrumentaton of TGA with NULL and DEFLECTION Balanaces

Lecture 36 TGA instrumentation and factors affecting TGA Curve

Lecture 37 How to perform sample analysis on TGA

Section 10: Differential Thermal Analysis

Lecture 38 DTA principle, and Instrumentation

Lecture 39 DTA applications, factors affecting the analysis

Section 11: Differential Scanning Calorimetry

Lecture 40 Principle of DSC, DSC Types and Power Compensaton method

Lecture 41 Heat Flux Method and DSC Curves

Lecture 42 Factors affecting DSC and Applications of DSC

The course aims to provide a comprehensive understanding of advanced materials characterization techniques, enabling students to leverage these methods to advance their research, enhance material performance, and contribute to technological innovations. This course is particularly helpful for: Graduate Students, Research Professionals, Materials Scientists, Materials Engineers and Interdisciplinary scientist