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    3. "Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films" ed. by C.A. Evans, C.R. Brundle, S. Wilson

    "Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films" ed. by C.A. Evans, C.R. Brundle, S. Wilson

    Posted By: exLib
    Date: 17 Oct 2011 05:35:34
    "Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films" ed. by C.A. Evans, C.R. Brundle, S. Wilson

    "Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films" ed. by Charles A. Evans, C. Richard Brundle, Shaun Wilson
    Materials Characterization Series
    Вuttеrwоrth-Неinеmаnn | 1992 | ISBN: 0750691689 9780750691680 | 782 pages | PDF | 20 MB

    This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis.
    An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.

    Contents
    Preface to Series
    Preface
    Acronyms Glossary
    Contributors
    INTRODUCTION AND SUMMARIES
    IMAGING TECHNIQUES (MICROSCOPY)
    ELECTRON BEAM INSTRUMENTS
    STRUCTURE DETERMINATION BY DIFFRACTION AND SCATTERING
    ELECTRON EMISSION SPECTROSCOPIES
    X-RAY EMISION TECHNIQUES
    VISIBLE/W EMISSION, REFLECTION, AND ABSORPTION
    VIBRATIONAL SPECTROSCOPIES AND NMR
    ION SCATTERING TECHNIQUFS
    MASS AND OPTICAL SPECTROSCOPIES
    NEUTRON AND NUCLEAR TECHNIQUES
    PHYSICAL AND MAGNETIC PROPERTIES
    Index
    with TOC BookMarkLinks



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