Machine Learning in VLSI Computer-Aided Design
Ibrahim (Abe) M. Elfadel, Duane S. Boning, et al., "Machine Learning in VLSI Computer-Aided Design"
English | ISBN: 3030046656 | 2019 | 694 pages | PDF, EPUB | 116 MB
English | ISBN: 3030046656 | 2019 | 694 pages | PDF, EPUB | 116 MB
This book provides readers with an up-to-date account of the use of machine learning frameworks, methodologies, algorithms and techniques in the context of computer-aided design (CAD) for very-large-scale integrated circuits (VLSI). Coverage includes the various machine learning methods used in lithography, physical design, yield prediction, post-silicon performance analysis, reliability and failure analysis, power and thermal analysis, analog design, logic synthesis, verification, and neuromorphic design.
Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability;
Discusses the use of machine learning techniques in the context of analog and digital synthesis;
Demonstrates how to formulate VLSI CAD objectives as machine learning problems and provides a comprehensive treatment of their efficient solutions;
Discusses the tradeoff between the cost of collecting data and prediction accuracy and provides a methodology for using prior data to reduce cost of data collection in the design, testing and validation of both analog and digital VLSI designs.