Tags
Language
Tags
July 2025
Su Mo Tu We Th Fr Sa
29 30 1 2 3 4 5
6 7 8 9 10 11 12
13 14 15 16 17 18 19
20 21 22 23 24 25 26
27 28 29 30 31 1 2
    Attention❗ To save your time, in order to download anything on this site, you must be registered 👉 HERE. If you do not have a registration yet, it is better to do it right away. ✌

    https://sophisticatedspectra.com/article/drosia-serenity-a-modern-oasis-in-the-heart-of-larnaca.2521391.html

    DROSIA SERENITY
    A Premium Residential Project in the Heart of Drosia, Larnaca

    ONLY TWO FLATS REMAIN!

    Modern and impressive architectural design with high-quality finishes Spacious 2-bedroom apartments with two verandas and smart layouts Penthouse units with private rooftop gardens of up to 63 m² Private covered parking for each apartment Exceptionally quiet location just 5–8 minutes from the marina, Finikoudes Beach, Metropolis Mall, and city center Quick access to all major routes and the highway Boutique-style building with only 8 apartments High-spec technical features including A/C provisions, solar water heater, and photovoltaic system setup.
    Drosia Serenity is not only an architectural gem but also a highly attractive investment opportunity. Located in the desirable residential area of Drosia, Larnaca, this modern development offers 5–7% annual rental yield, making it an ideal choice for investors seeking stable and lucrative returns in Cyprus' dynamic real estate market. Feel free to check the location on Google Maps.
    Whether for living or investment, this is a rare opportunity in a strategic and desirable location.

    X-Ray Diffraction by Polycrystalline Materials

    Posted By: DZ123
    X-Ray Diffraction by Polycrystalline Materials

    René Guinebretière, "X-Ray Diffraction by Polycrystalline Materials"
    English | 2007 | ISBN: 1905209215 | PDF | pages: 384 | 6.1 mb

    This book presents a physical approach to the diffraction phenomenon and its applications in materials science.
    An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction.

    Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.