ESD: Failure Mechanisms and Models
ESD: Failure Mechanisms and Models By Steven H. Voldman
2009 | 397 Pages | ISBN: 0470511370 | PDF | 18 MB
2009 | 397 Pages | ISBN: 0470511370 | PDF | 18 MB
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit methodology. ESD: Failure Mechanisms and Models is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the Nano-electronic era.