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    3. Scanning Microscopy for Nanotechnology: Techniques and Applications (Repost)

    Scanning Microscopy for Nanotechnology: Techniques and Applications (Repost)

    Posted By: Specialselection
    Date: 7 Jan 2014 22:51:20
    Scanning Microscopy for Nanotechnology: Techniques and Applications (Repost)

    Weilie Zhou, Zhong Lin Wang, "Scanning Microscopy for Nanotechnology: Techniques and Applications"
    English | 2006-12-18 | ISBN: 0387333258 | 534 pages | PDF | 112 mb

    This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

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