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    3. Scanning Probe Microscopy (2 Volume Set): Electrical and Electromechanical Phenomena at the Nanoscale

    Scanning Probe Microscopy (2 Volume Set): Electrical and Electromechanical Phenomena at the Nanoscale

    Posted By: step778
    Date: 10 Nov 2014 13:26:01
    Scanning Probe Microscopy (2 Volume Set): Electrical and Electromechanical Phenomena at the Nanoscale

    Sergei V. Kalinin, Alexei Gruverman, "Scanning Probe Microscopy (2 Volume Set): Electrical and Electromechanical Phenomena at the Nanoscale"
    2007 | pages: 1002 | ISBN: 0387286675 | DJVU | 12,9 mb

    Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

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