Integrated Imaging and Vision Techniques for Industrial Inspection

by Zheng Liu (Editor), Hiroyuki Ukida (Editor), Pradeep Ramuhalli (Editor), Kurt Niel (Editor)
Presents the latest technologies and solutions for industrial inspection
Covers both theoretical advances and current engineering practices
Includes case studies that illustrate applications of the techniques to real problems

From the Back Cover
This pioneering text/reference presents a detailed focus on the use of machine vision techniques in industrial inspection applications. An internationally renowned selection of experts provide insights on a range of inspection tasks, drawn from their cutting-edge work in academia and industry, covering practical issues of vision system integration for real-world applications.

Topics and features:

Presents a comprehensive review of state-of-the-art hardware and software tools for machine vision, and the evolution of algorithms for industrial inspection
Includes in-depth descriptions of advanced inspection methodologies and machine vision technologies for specific needs
Discusses the latest developments and future trends in imaging and vision techniques for industrial inspection tasks
Provides a focus on imaging and vision system integration, implementation, and optimization
Describes the pitfalls and barriers to developing successful inspection systems for smooth and efficient manufacturing process
Bridging the gap between theoretical knowledge and engineering practice, this indispensable book will appeal to graduate students interested in imaging, machine vision, and industrial inspection. The work also serves as an excellent reference for researchers seeking to develop innovative solutions to tackle practical challenges, and for professional engineers who will benefit from the coverage of applications at both system and component level.

About the Author
Dr. Zheng Liu is an Associate Professor at the University of British Columbia, Kelowna, BC, Canada.
Dr. Hiroyuki Ukida is an Associate Professor in the Institute of Technology and Science at the University of Tokushima, Japan.
Dr. Pradeep Ramuhalli is a Senior Research Scientist at the Pacific Northwest National Laboratory, Richland, WA, USA. Dipl.-Ing. Kurt Niel is the Head of the Department of Metrology and Control Engineering at the University of Applied Sciences Upper Austria, Wels, Austria.

Number of Illustrations and Tables
394 illus., 13 in colour
Topics
Image Processing and Computer Vision
Pattern Recognition

More info and Hardcover at Springer

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