Nanoscale Characterization of Surfaces and Interfaces (Repost)
N. John Dinardo, "Nanoscale Characterization of Surfaces and Interfaces"
English | 1994-06-21 | ISBN: 3527292470 | 173 pages | PDF | 14 MB
English | 1994-06-21 | ISBN: 3527292470 | 173 pages | PDF | 14 MB
Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them.
Topics include:
Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charge Density Wave Systems * Superconductors * Electrochemisty at Liquid-Solid Interfaces * Biological Systems * Metrological Applications * Nanoscale Surface Forces * Nanotribology * Manipulation on the Nanoscale
Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of information.